133.293 Electron Microscopy: Principles & Fundamentals
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2024S, VO, 2.0h, 3.0EC

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture
  • Format: Presence

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

With respect to the lecture notes (in German language) the structure of the lecture is as follows:

  1. Introduction (history of electron microscopy, explaination of various types of electron microscopes)
  2. Electron optics (properties of an image, geometric optics of a sammellens, aberrations, resolution limits, aberration correction)
  3. Scanning electron microscopy (construction, electron penetration in matter, imaging methods, environmental SEM, EBIC, 3D-SEM)
  4. Transmission electron microscopy (contruction, electron sources, lens systems, detectors, sample preparation)
  5. Imaging methods in TEM (electron diffraction, bright field, dark field, konematic diffraction theory, dynamic diffraction theory, phase contrast, HRTEM, Lorentz-microscopy, holography, tomography)
  6. Simulation of HRTEM images (modeling of the specimen, exit wave, reconstruction methods)
  7. scanning transmission electron microscopy (functional principles, detectors, imaging methods, differential phase contrast)
  8. In-situ electron microscopy (in SEM, in TEM)
  9. low-voltage electron microscopy (beam damage, mean free path length, SEM, TEM)
  10. analytical electron microscopy (applications, inelastic electron-matter interactions, EELS, EDX, CL)

Teaching methods

Frontal lecture

Mode of examination

Immanent

Additional information

General Introduction of the lecture:

Montag, 4. März 2024, 14:00-15:00, FH HS 5

 


Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Mon14:00 - 16:0011.03.2024 - 24.06.2024Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Tue14:00 - 16:0007.05.2024FH Hörsaal 2 Vorlesung Ausweichtermin
Electron Microscopy: Principles & Fundamentals - Single appointments
DayDateTimeLocationDescription
Mon11.03.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon18.03.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon08.04.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon15.04.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon22.04.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon29.04.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon06.05.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Tue07.05.202414:00 - 16:00FH Hörsaal 2 Vorlesung Ausweichtermin
Mon13.05.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon27.05.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon03.06.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon10.06.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon17.06.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie
Mon24.06.202414:00 - 16:00Sem.R. DB gelb 07 Grundlagen der Elektronenmikroskopie

Examination modalities

oral exaimnation or TUWEL-continous assesment

Course registration

Not necessary

Curricula

Study CodeObligationSemesterPrecon.Info
033 261 Technical Physics Mandatory elective
066 434 Materials Sciences Not specified
066 460 Physical Energy and Measurement Engineering Mandatory elective
066 461 Technical Physics Mandatory elective
066 461 Technical Physics Mandatory elective
066 490 Technical Chemistry Not specified
412 Subject: Physics Mandatory elective
810 Technical Physics Mandatory elective
810 Technical Physics Mandatory elective

Literature

Lecture notes for this course are available for 15 EUR. The lecture notes are further used for the  LVA 138.103 Techniken der analytischen Elektronenmikroskopie.

Previous knowledge

Solid State Physics

Accompanying courses

Continuative courses

Miscellaneous

Language

if required in English