138.103 Techniques of analytical elctron microscopy
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2022W, VO, 2.0h, 3.0EC

Properties

  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture
  • Format: Presence

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

With respect to the lecture notes (in German language) the structure of the lecture is as follows:

  1. Introduction to the analytial methods
  2. elastic electron scattering (Rutherford scattering, screened Potential, Bragg scattering, phonon scattering)
  3. inelastic electron scattering (Bethe theory, dielectric formalism, plasmon excitations, differetial scattering crossection, KKA, multiple scattering, ionization, ELNES)
  4. electron energy loss spectrometry (spectrometer, energy resolution, detection, detection limits, spatial resolution)
  5. energy filtered TEM (ZLP filtering, plasmon filtering, elemental maps)
  6. X-ray spectrometry (detector, excitation volums, nomenclature, artifacts)
  7. cathodoluminescence (spectrometer, diffraction at a slit, diffration at a lattice, electron-hole-pair recombination, Cerenkov radiation, transition radiation)
  8. chemical microanalysis (in EELS, in EDX)
  9. actual research topics (plsamonics, phase manipulation, orbital mapping)

 

Teaching methods

Frontal Lecture

WS2022: live lecture again!

Mode of examination

Oral

Additional information

Preliminary discussion of all IFP elective lectures: Montag, 03.10.2022, 15.00 - 17.00 Uhr, FH HS 6

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Lecture notes for this course are available for 15 EUR. The lecture notes are further used for the LVA 133.293 Electron Microscopy: Principles & Fundamentals.

Lecturers

Institute

Course dates

DayTimeDateLocationDescription
Mon14:00 - 16:0010.10.2022 - 23.01.2023Sem.R. DC rot 07 weekly lecture
Techniques of analytical elctron microscopy - Single appointments
DayDateTimeLocationDescription
Mon10.10.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon17.10.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon24.10.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon07.11.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon14.11.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon21.11.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon28.11.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon05.12.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon12.12.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon19.12.202214:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon09.01.202314:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon16.01.202314:00 - 16:00Sem.R. DC rot 07 weekly lecture
Mon23.01.202314:00 - 16:00Sem.R. DC rot 07 weekly lecture

Examination modalities

oral examination

Course registration

Begin End Deregistration end
15.09.2022 12:00 25.10.2022 13:20 25.10.2022 13:20

Curricula

Literature

Lecture notes (in German language) are available at the beginning of the lecture series.

Previous knowledge

Positive examination in "VO 133.293 - Fundamentals of Electron Microscopy" is advised.

Preceding courses

Accompanying courses

Miscellaneous

Language

German