138.103 Techniques of analytical elctron microscopy
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2021W, VO, 2.0h, 3.0EC


  • Semester hours: 2.0
  • Credits: 3.0
  • Type: VO Lecture
  • Format: Distance Learning

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

With respect to the lecture notes (in German language) the structure of the lecture is as follows:

  1. Introduction to the analytial methods
  2. elastic electron scattering (Rutherford scattering, screened Potential, Bragg scattering, phonon scattering)
  3. inelastic electron scattering (Bethe theory, dielectric formalism, plasmon excitations, differetial scattering crossection, KKA, multiple scattering, ionization, ELNES)
  4. electron energy loss spectrometry (spectrometer, energy resolution, detection, detection limits, spatial resolution)
  5. energy filtered TEM (ZLP filtering, plasmon filtering, elemental maps)
  6. X-ray spectrometry (detector, excitation volums, nomenclature, artifacts)
  7. cathodoluminescence (spectrometer, diffraction at a slit, diffration at a lattice, electron-hole-pair recombination, Cerenkov radiation, transition radiation)
  8. chemical microanalysis (in EELS, in EDX)
  9. actual research topics (plsamonics, phase manipulation, orbital mapping)


Teaching methods

Frontal Lecture

WS2021: TUwel course.

Mode of examination


Additional information

Vorbesprechung: Montag, 4. Oktober 2021, 12:00-13:00 Uhr, via ZOOM-Meeting:



Lecture notes for this course are available for 15 EUR. The lecture notes are further used for the LVA 133.293 Electron Microscopy: Principles & Fundamentals.



Examination modalities

oral examination (WS 2021: TUWEL)

Course registration

Begin End Deregistration end
28.09.2021 12:00 26.10.2021 13:20 26.10.2021 13:20



Lecture notes (in German language) are available at the beginning of the lecture series.

Previous knowledge

Positive examination in "VO 133.293 - Fundamentals of Electron Microscopy" is advised.

Preceding courses

Accompanying courses