After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.
Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)
Interactive Course
ATTENTION: the course is 4h a day in the same room. Consequently, there is an increased infection risk. Therefore FFP2 mask will be obligatory.
Registration only via the group registration form.
Priority is given to those students who need transmission electron microscopy directly for their research and will use it independently.
Unfortunately, there is no guarantee of a placement.
Therefore, if you are interested, please contact one of the lecturers by 26.9. for further planning.
There will be one block for english speaking students.
Planned dates WS 2022/23:
The TEM work will take place in the TEM laboratory in the Freihaus (8th floor, yellow tower).
Duration: usually 09:00 to 13:00
-----------------------------------------------------
Theory block for all groups
Fri 7.10.2022
-----------------------------------------------------
Group 1 (English):
Monday 10.Oct. 13:00-17:00 (!)
Tuesday 11.Oct.
Wednesday 12 Oct.
Thursday 13 Oct.
Friday 14 Oct.
Monday 24 Oct.
Tuesday 25 Oct.
Thursday 27 Oct.
Due to the current situation, the internship can only be carried out in a safety-conscious manner. FFP2 masks are mandatory.
Priority is given to those students who need transmission electron microscopy directly for their research and will use it independently.
Unfortunately, there is no guarantee of a place on the practical course.
Please contact one of the lecturers for registration and further planning.
Lecture notes for this course are available.
Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)
Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (2008) (recommended)
Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Einführung in die Elektronenmikroskopie - Heimendahl, Manfred von (1984)
Electron microscopy of materials - Heimendahl, Manfred von (1980)
Electron microscopy of thin crystals - Hirsch, P. B. (1977)
High-resolution electron microscopy - Spence, John C. H. (2008)
Transmission electron microscopy of materials - Thomas, Gareth (1990) Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)
