138.049 Electron microscopy
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2020W, PR, 4.0h, 5.0EC, to be held in blocked form
TUWEL

Properties

  • Semester hours: 4.0
  • Credits: 5.0
  • Type: PR Project
  • Format: Hybrid

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

Principle of transmission electron microscopy (TEM)
Practical work Setup, alignment :
- illuminating system
- objective lens
- lens aberrations Applications
- bright field (MAG, SAMAG)
- dark field
- electron diffraction
- taking images(CCD, plate camera) microanalysis in the TEM
- Energy Loss Spectrometry (EELS)
- Energy dispersive X-ray microanalysis (EDS)
- Image Filter (GIF)
- Scanning transmission electron microscopy (STEM)
- Bright Field, Dark Field and High Angle Annular Dark Field (DF, BF, HAADF)

Teaching methods

Interactive Course

Mode of examination

Written and oral

Additional information

Due to the current situation, the practical training in the WS2020/21 can unfortunately only be carried out in a very limited and safety-conscious manner in small groups.

Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.

Unfortunately, there is no guarantee for participation in the praktikum.
Therefore, if you are interested, please contact one of the lecturers in order to make further plans.

Lecturers

Institute

Examination modalities

Certificate

Course registration

Begin End Deregistration end
19.08.2020 00:00 08.10.2020 12:00 06.10.2020 12:00

Registration modalities

Due to the current situation, the internship in the WS2020/21 can unfortunately only be carried out in very small groups in a very limited and safety-conscious manner.

Priority is given to those students who need transmission electron microscopy directly for their research and who will apply it independently.

Unfortunately, there is no guarantee for an internship.
Please contact one of the lecturers to register and to make further plans.

Application is currently locked manually.

Curricula

Study CodeSemesterPrecon.Info
066 434 Materials Sciences

Literature

Lecture notes for this course are available.

Transmission electron microscopy - Williams, David B. and Carter, C.Barry (recommended) (1996,2009)

Transmission Electron Microscopy: Physics of Image Formation - Reimer, Ludwig und Kohl, Helmut (2008) (recommended)

Physikalische Grundlagen der Elektronenmikroskopie - Alexander, Helmut (1997)
Physical principles of electron microscopy - Egerton, Ray F. (2005)
Einführung in die Elektronenmikroskopie - Heimendahl, Manfred von (1984)
Electron microscopy of materials - Heimendahl, Manfred von (1980)
Electron microscopy of thin crystals - Hirsch, P. B. (1977)
High-resolution electron microscopy - Spence, John C. H. (2008)
Transmission electron microscopy of materials - Thomas, Gareth (1990) Elektronenmikroskopische Untersuchungs- und Präparationsmethoden - Reimer, Ludwig (1984)
Fundamentals of inelastic electron scattering - Schattschneider, Peter (1986)

Accompanying courses

Continuative courses

Miscellaneous

  • Attendance Required!

Language

if required in English