133.027 Electron microscopy of semiconducting materials, project task
This course is in all assigned curricula part of the STEOP.
This course is in at least 1 assigned curriculum part of the STEOP.

2022W, PR, 8.0h, 10.0EC, to be held in blocked form

Properties

  • Semester hours: 8.0
  • Credits: 10.0
  • Type: PR Project
  • Format: Hybrid

Learning outcomes

After successful completion of the course, students are able to comprehend the materials presented in the lecture and to draw conclusions from them, as well as to actively communicate the contents presented during the lecture.

Subject of course

Preparation of specimens for TEM, introduction to practical usage of the TEM instrument. Introduction to measure image contrast and diffraction information. Usage of computer simulation programs for the interpretation of defect analysis. Solving a practial problem of a TEM analysis of semiconductors or ceramics.

Teaching methods

Interactive Course

Mode of examination

Immanent

Additional information

no detailed knowledge necessary but : lectures: High Resolution TEM(133.031), Dislocations in Solids and some basic knowledge of solid state physics are useful.

Lecturers

Institute

Examination modalities

Protocol

Course registration

Registration modalities

Sprechzimmer, 8. Stock Turm B

Curricula

Literature

Lecture notes for this course are available. is handed at the beginning

Previous knowledge

basic knowledge of solid state physics is useful

Miscellaneous

  • Attendance Required!

Language

German